
FAA20 Embedded NEXCOM Vocoder
Board Manual
This manual has been prepared for the Federal Aviation Administration.
FA100-00107 (March 2004) – Rev 1.0.0 Page 95
8.3.30 TEST
The TEST command is used to access test/integration tools, signal
processing functions, and built-in hardware test functions. Test/integration
tools include a COM3 monitor, port test pattern controls, and a vocoder bit
exactness test mode. The signal processing functions include a tone
detector and a coarse spectrum analyzer. These signal processing
functions are ‘connected’ to the COM port of the linear mixer, thus any
signal to be evaluated must be mixed into this port. Hardware test
functions are used at the factory and require a special external loop back
adapter.
The command syntax for all test functions is provided below. For
operational details, see Section 7.2.
Table 41: TEST Command Syntax
ATTRIBUTE DESCRIPTION
SYNTAX TEST [param [onstate]] Test/Integration Tools
TEST TRIG [noff toff] Test/Integration Tool
TEST FFT [uopt] Signal Processing Function
TEST SWEEP [uopt] Signal Processing Function
TEST CALRX Signal Processing Function
TEST TONDET Signal Processing Function
TEST htest [hopt] Hardware Test Functions
param Test Parameters .
BITEXACT= Bit Exact Test Mode (supports vocoder tests)
COM3 = COM3 Port Monitor (prints traffic to COM2)
NTX = Nibble Test (enables nibble TX test pattern)
PTX = PCM Test (enables PCM TX counting pattern)
TXINIT = Vocoder Control Nibble Initialize Bit
TXMUTE= Vocoder Control Nibble Mute Bit
TXLOST= Vocoder Control Nibble Lost Bit
TXCLEAR=Expanded Control Nibble Error Clear Bit
C1FMT = ASCII Compressed Voice Long Format (C1)
onstate ON Enables the test feature.
OFF Disables the test feature.
noff
FMDE→FMEN Offset (Normal Timing). When the NIBCLK
source is internally generated (master mode), normal timing
is enabled, and the unit is in TEST mode, this controls the
positioning of the FMEN pulse relative to the FMDE pulse.
The value represents the number of NIBCLKs to wait before
asserting the FMEN pulse.
PARAMETERS
toff
FMDE→FMEN Offset (Truncated Timing). When the
NIBCLK source is internally generated (master mode),
truncated timing is enabled, and the unit is in TEST mode,
this controls the positioning of the FMEN pulse relative to the
FMDE pulse. The value represents the number of NIBCLKs
to wait before asserting the FMEN pulse.
Comentarios a estos manuales